Ikerketa eta Transferentzia taldeak

MAESTRO WATSON, DANIEL

Dagokion taldea: Robotika eta Automatizazioa  

Izen abizenak: DANIEL MAESTRO WATSON
Herritartasuna:
Harremanetarako Telefonoa: 943794700
Kontaktatu



Formakuntza

Doktoregoa

  • PROGRAMA DOCTORADO EN INGENIERÍA APLICADA, 3D inspection methods for specular or partially specular surfaces, MONDRAGON UNIBERTSITATEA, 2020

Lizentziatua, Ingeniaria, Gradua, Arkitektoa

  • INGENIERÍA TÉCNICA DE TELECOMUNICACIÓN, ESPECIALIDAD EN TELEMÁTICA, MONDRAGON UNIBERTSITATEA, 2010
  • TELEKOMUNIKAZIOKO INGENIARITZA, MONDRAGON UNIBERTSITATEA, 2013

Egungo lan egoera

  • Erakundea: Mondragon Unibertsitatea
  • Zentroa: Goi Eskola Politeknikoa
  • Departamentua: Elektronika eta Informatika
  • Ezagutza arloa: Ingeniería de sistemas y automática
  • Kontratazio mota: Contratado
  • Maila/Lanpostua: PDI
  • Ikerketa taldea: Robotika eta Automatizazioa

Txostenak kongresuetan/Konferentziak

Deflectometric data Segmentation based on Fully Convolutional Neural Networks

Fourteenth International Conference on Quality Control by Artificial Vision Conference. Proceedings of SPIE. Vol. 11172. Article UNSP 1117209. SPIE,

Urtea: 2019

Egileak: Daniel Maestro-Watson, Julen Balzategui, Luka Eciolaza, Nestor Arana-Arexolaleiba

LCD Screen Calibration for Deflectometric Systems Considering a Single Layer Refraction Model

IEEE International Workshop of Electronics, Control, Measurement, Signals and their application to Mechatronics (ECMSM). San Sebastián. 24-26 May. IEEE,

Urtea: 2017

Egileak: Daniel Maestro-Watson, Alberto Izaguirre and Nestor Arana-Arexolaleiba

A simple deflectometric method for measurement of Quasi-Plane specular surfaces

IEEE International Workshop of Electronics, Control, Measurement, Signals and their Application to Mechatronics (ECMSM). Liberec. 22-24 June. Pp. 1 - 6,

Urtea: 2015

Egileak: D. Maestro-Watson, A. Izaguirre, N. Arana-Arexolaleiba, A. Iturrospe

Deep Learning for Deflectometric Inspection of Specular Surfaces

International Joint Conference SOCO’18-CISIS’18-ICEUTE’18. Advances in Intelligent Systems and Computing. San Sebastián. 6-8 junio. Graña M. et al. editores. Vol 771. Pp. 280-289. Springer,

Urtea: 2019

Egileak: Daniel Maestro-Watson, Julen Balzategui, Luka Eciolaza, Nestor Arana-Arexolaleiba

Hizkuntzen ezagutza

  • Ingelesa (C1)

FORMAKUNTZA

  • IRAKASKUNTZAREN JARDUERA

    AURREKO LAN ESPERIENTZIA

  • Deflectometric data segmentation for surface inspection: a fully convolutional neural network approach

    ARTICULO  |  Journal of Electronic Imaging. Vol. 29. N. 4. N. artículo, 041007,

    Urtea: 2020  |  ISBN/ISSN: 1560-229X

    Egilea: MAESTRO WATSON, DANIEL   BALZATEGUI ORUNA, JULEN   ECIOLAZA ECHEVERRIA, LUKA   ARANA AREXOLALEIBA, NESTOR  

    Deflectometric data Segmentation based on Fully Convolutional Neural Networks

    COMUNICACION_CONGRESO  |  Fourteenth International Conference on Quality Control by Artificial Vision Conference. Proceedings of SPIE. Vol. 11172. Article UNSP 1117209. SPIE,

    Urtea: 2019  |  ISBN/ISSN: 9781510630543

    Egilea: MAESTRO WATSON, DANIEL   BALZATEGUI ORUNA, JULEN   ECIOLAZA ECHEVERRIA, LUKA   ARANA AREXOLALEIBA, NESTOR  

    Deep Learning for Deflectometric Inspection of Specular Surfaces

    COMUNICACION_CONGRESO  |  International Joint Conference SOCO’18-CISIS’18-ICEUTE’18. Advances in Intelligent Systems and Computing. San Sebastián. 6-8 junio. Graña M. et al. editores. Vol 771. Pp. 280-289. Springer,

    Urtea: 2019  |  ISBN/ISSN: 978-3-319-94120-2 online

    Egilea: MAESTRO WATSON, DANIEL   BALZATEGUI, JULEN   ECIOLAZA ECHEVERRIA, LUKA   ARANA AREXOLALEIBA, NESTOR  

    LCD Screen Calibration for Deflectometric Systems Considering a Single Layer Refraction Model

    COMUNICACION_CONGRESO  |  IEEE International Workshop of Electronics, Control, Measurement, Signals and their application to Mechatronics (ECMSM). San Sebastián. 24-26 May. IEEE,

    Urtea: 2017  |  ISBN/ISSN: 9781509055821

    Egilea: MAESTRO WATSON, DANIEL   IZAGUIRRE ALTUNA, ALBERTO   ARANA AREXOLALEIBA, NESTOR  

    A simple deflectometric method for measurement of Quasi-Plane specular surfaces

    COMUNICACION_CONGRESO  |  IEEE International Workshop of Electronics, Control, Measurement, Signals and their Application to Mechatronics (ECMSM). Liberec. 22-24 June. Pp. 1 - 6,

    Urtea: 2015  |  ISBN/ISSN: 9781479969708

    Egilea: MAESTRO WATSON, DANIEL   ITURROSPE IREGUI, AITZOL   IZAGUIRRE ALTUNA, ALBERTO   ARANA AREXOLALEIBA, NESTOR  

    Egindako tesiak

    3D inspection methods for specular or partially specular surfaces

    Irakurtze data:  2020-04-22

    Zuzendaria: Nestor Arana Arexolaleiba

    Egilea: MAESTRO WATSON, DANIEL